TestInsight
Q-Star
Ridgetop








 

 

 

 

 

 

 

 






 












    

    IP core library

    Design-for-Manufacturing Tools for High-Performance ICs

    Comprehensive prognostic solution from die level to system

      

  



        InstaCell

    High speed/high resolution ADC/DAC converter

    Band Gap Reference (BGR)

    OP amp

    Design service




         DFM

    PDKCheck - Independent Die-Level Process Monitor

      -Ridgetop’s PDKChek measures die-level process-induced
       variations, both random and systematic, in MOS transistor
       threshold voltage (VT), resistance, capacitance, and turn
       on/off current.


     

   YieldMaxx

     - Independent Die-Level Fab Process Monitoring Tools

      



       nanoDFM

    TDDB EPU

      –Time-Dependent Dielectric Breakdown Electronic Prognostics
      Unit

    NBTI EPU

      –Negative Bias Temperature Instability Electronic Prognostic
      Unit

    Radiation-Hardened Design Services



       Prognostic

    Design for Condition-Base Maintenance