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IDDq design and testing solution
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Test time (cost) reduction
Q-Star Test’ static/quiescent current measurement instruments
(also referred to as Iddq or Issq modules) serve a wide range
of applications:
Standard and advanced Iddq tests
Stand-by current measurements
Power-down current measurements
Bias current measurements
Average current measurements
Analog DC and low frequency current measurements
Equally, Q-Star Test’s dynamic current measurement instruments
(also referred to Iddt modules) serve a wide range of applications:
Dynamic and transient (Iddt) current tests
Power profiling of circuits and systems
Active current consumption
E-fuse programming validation
Improving your Device Quality by
Extended IDDQ measurements
Advanced IDDQ test strategies
Fast Low Current measurements
Static or Dynamic Power Profiling on
Semiconductor devices
LEDs/OLEDs
Electronic circuits and systems
Dynamic Current Analysis
Fast measurements of Leakage Currents.
Highly accurate “normal” Current Measurements
by tiny high resolution modules
Fast and precise measurements of bias, stand-by,
power-down currents
Q-STAR modules can come with various smart on-line data analysis
functions
–capable to support the user with various data analysis functions
on the module itself and thereby accelerating the data processing.
Effective Cost Reduction is another key benefit from using Q-STAR
modules:
–Higher Speed ( up to 100x on IDDQ Measurements) reduces the
number of required test cells.
–Tiny instruments (modules) directly fit on Probe Cards, Load or
PCB-boards.
–Advanced quality control results in higher yields.
Besides its modules Q-STAR likes to support/consult you any time
with
–High quality Engineering work DFT and Test Strategy Improvemen.
Qstar Product
Product list
Add-on module
•Wide current measurement range – up to several A
•Wide capacitor load range – up to several uF
•Simple control interface – 3-wire
•Easy integration
Q-Star Test Solutions
Reduce Test Time & Costs
Reduce number of test vectors
Minimize Test Repetitions
Improve IC Quality and Reliability
Support Fast and Easy Failure Analysis
Improve Test Data Quality
Better Decision making
