”@”@”@”@IDDq design and testing solution
”@”@”@ ”@Q-Star Test”¦ static/quiescent current measurement instruments ”@”@”@”@Standard and advanced Iddq tests ”@”@”@”@Stand-by current measurements ”@”@”@”@Power-down current measurements ”@”@”@”@Bias current measurements ”@”@”@”@Average current measurements ”@”@”@”@Analog DC and low frequency current measurements ”@ ”@”@”@”@Dynamic and transient (Iddt) current tests ”@”@”@”@Power profiling of circuits and systems ”@”@”@”@Active current consumption ”@”@”@”@E-fuse programming validation ”@”@ ”@”@”@”@Static or Dynamic Power Profiling on ”@”@”@”@Dynamic Current Analysis ”@”@”@”@Fast measurements of Leakage Currents. ”@”@”@”@Highly accurate ”§normal”Ø Current Measurements ”@”@”@”@Fast and precise measurements of bias, stand-by, ”@”@”Vcapable to support the user with various data analysis functions ”@Effective Cost Reduction is another key benefit from using Q-STAR ”@”@”VHigher Speed ( up to 100x on IDDQ Measurements) reduces the ”@Besides its modules Q-STAR likes to support/consult you any time ”@”@”VHigh quality Engineering work DFT and Test Strategy Improvemen. ”@”@”@”@”@”@Qstar Product ”@”@”@”@Product list ”@”@”@”@Add-on module ”@”@”@”@”@”EWide current measurement range ”V up to several A ”@”@”@”@”@”@Q-Star Test Solutions ”@”@”@”@Reduce Test Time & Costs ”@”@”@”@”@”@Reduce number of test vectors ”@”@”@”@Improve IC Quality and Reliability ”@”@”@”@Support Fast and Easy Failure Analysis ”@”@”@”@Improve Test Data Quality ”@”@”@”@”@”@Better Decision making |
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